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N. Yogesh

Researcher at Indian Institute of Technology Madras

Publications -  7
Citations -  42

N. Yogesh is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Photonic crystal & Metamaterial. The author has an hindex of 2, co-authored 7 publications receiving 34 citations.

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Cross polarization converter formed by rotated-arm-square chiral metamaterial

TL;DR: Optical activity and cross polarization conversion of a rotated-arm-square chiral metamaterial (CMM) is reported in this article, which shows strong chirality owing to the cross coupling between the induced magnetic field and incident electric field of the applied electromagnetic wave.
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Spatial Beam Compression and Effective Beam Injection Using Triangular Gradient Index Profile Photonic Crystals

TL;DR: In this article, the authors proposed the use of the triangular gradient index photonic crystals (GRIN PC) for the design of spatial beam compressor owing to its functionalities, but the fabrication of a graded media with the parabolic proflle is a challenge in practical realization.
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Field confinement and quality factor of the multilayer cavity resonators

TL;DR: In this article, the field confinement aspect of a multilayer cavity resonator formed by a one-dimensional photonic crystal with prism wedge configuration is described, and an attempt has been taken to achieve the vertical confinement of light for a few of the resonant modes so that the proposed cavities may be implemented for microwave applications, especially in spectroscopic techniques.
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Near Field Focusing Effect and Hyperbolic Dispersion in Dielectric Photonic Crystals

TL;DR: In this paper, the authors investigated the near fleld focusing behavior corresponding to the hyperbolic dispersion regime at the second band of the square lattice photonic crystal (PC).
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Application of Defect Induced Microwave Band Gap Structure for Non-destructive Evaluation and the Construction of a Frequency Selector Switch

TL;DR: In this article, the authors studied the appearance of a point defect mode within the band gap of a microwave band gap structure for the use as a tool to evaluate the dielectric constant of the material at the defect site.