A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

We first provide an overview of 3-D shape measurement us- ing various optical methods. Then we focus on structured light tech- niques where various optical configurations, image acquisition tech- niques, data postprocessing and analysis methods and advantages and limitations are presented. Several industrial application examples are presented. Important areas requiring further R&D are discussed. Finally, a comprehensive bibliography on 3-D shape measurement is included, although it is not intended to be exhaustive. © 2000 Society of Photo-Optical Instrumentation Engineers. (S0091-3286(00)00101-X)

Overview of three-dimensional shape measurement using optical methods

Digital holography is an emerging field of new paradigm in general imaging applications. We present a review of a subset of the research and development activities in digital holography, with emphasis on microscopy techniques and applications. First, the basic results from the general theory of holography, based on the scalar diffraction theory, are summarized, and a general description of the digital holographic microscopy process is given, including quantitative phase microscopy. Several numerical diffraction methods are described and compared, and a number of representative configurations used in digital holography are described, including off-axis Fresnel, Fourier, image plane, in-line, Gabor, and phase-shifting digital holographies. Then we survey numerical techniques that give rise to unique capabilities of digital holography, including suppression of dc and twin image terms, pixel resolution control, optical phase unwrapping, aberration compensation, and others. A survey is also given of representative application areas, including biomedical microscopy, particle field holography, micrometrology, and holographic tomography, as well as some of the special techniques, such as holography of total internal reflection, optical scanning holography, digital interference holography, and heterodyne holography. The review is intended for students and new researchers interested in developing new techniques and exploring new applications of digital holography.

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Principles and techniques of digital holographic microscopy

Direct shape measurement by digital wavefront reconstruction and multi-wavelength contouring

A procedure is proposed to calibrate a generic structured light system, consisting of one camera and one projector. The proposed pro- cedure is based on defining a unique coordinate system for both devices in the structured light system, and thus, a rigidity constraint is introduced into the transformation process. This constraint is used to derivate a simple function for the simultaneous estimation of the parameters, result- ing in parameters that are more reliable. The performance of the pro- posed procedure is shown on examples of the calibration of two different structured light systems. © 2004 Society of Photo-Optical Instrumentation Engi- neers. (DOI: 10.1117/1.1635373)

Accurate procedure for the calibration of a structured light system

A robust procedure for absolute phase measurement

Hochauflösende Vermessung ausgedehnter technischer Oberflächen mit skalierbarer Topometrie / Highly-Resolved Measurement of Extended Technical Surfaces with Scalable Topometry

Peter Andrä

Papers

A robust procedure for absolute phase measurement

Hochauflösende Vermessung ausgedehnter technischer Oberflächen mit skalierbarer Topometrie / Highly-Resolved Measurement of Extended Technical Surfaces with Scalable Topometry