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Philip Shilane

Researcher at EMC Corporation

Publications -  88
Citations -  5488

Philip Shilane is an academic researcher from EMC Corporation. The author has contributed to research in topics: Data deduplication & Cache. The author has an hindex of 30, co-authored 84 publications receiving 5141 citations. Previous affiliations of Philip Shilane include Data Domain & Princeton University.

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Proceedings ArticleDOI

The Princeton Shape Benchmark

TL;DR: It is concluded that no single descriptor is best for all classifications, and thus the main contribution of this paper is to provide a framework to determine the conditions under which each descriptor performs best.
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Modeling by example

TL;DR: This paper provides methods with which a user can search a large database of 3D meshes to find parts of interest, cut the desired parts out of the meshes with intelligent scissoring, and composite them together in different ways to form new objects.
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A planar-reflective symmetry transform for 3D shapes

TL;DR: This paper describes a planar reflective symmetry transform (PRST) that captures a continuous measure of the reflectional symmetry of a shape with respect to all possible planes and uses the transform to define two new geometric properties, center of symmetry and principal symmetry axes.
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A Comprehensive Study of the Past, Present, and Future of Data Deduplication

TL;DR: The background and key features of data deduplication are reviewed, the main applications and industry trend are discussed, and the state-of-the-art research in data dedeplication is classified according to the key workflow of the data dedUplication process.
Proceedings ArticleDOI

Characteristics of backup workloads in production systems

TL;DR: This paper presents a comprehensive characterization of backup workloads by analyzing statistics and content metadata collected from a large set of EMC Data Domain backup systems in production use, showing that backup storage differs significantly from their primary storage workload in the amounts of data churn and capacity requirements as well as the amount of redundancy within the data.