P
Philipp Woock
Researcher at Karlsruhe Institute of Technology
Publications - 15
Citations - 81
Philipp Woock is an academic researcher from Karlsruhe Institute of Technology. The author has contributed to research in topics: Sonar & Side-scan sonar. The author has an hindex of 5, co-authored 12 publications receiving 61 citations. Previous affiliations of Philipp Woock include Indian Institute of Technology Bombay & Fraunhofer Society.
Papers
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Proceedings ArticleDOI
Deep-sea AUV navigation using side-scan sonar images and SLAM
Philipp Woock,Christian Frey +1 more
TL;DR: An overview of existing approaches to underwater SLAM using sonar data is given and a short outlook to the system that will be used in the TIETeK project is presented.
Proceedings ArticleDOI
Odometry-Based Structure from Motion
TL;DR: In this article, the authors investigated the precision of the odometry data of a commercially available passenger car and developed an error model based on camera parameters and the bicycle model to identify the required precision.
Proceedings ArticleDOI
Deep-sea seafloor shape reconstruction from side-scan sonar data for AUV navigation
TL;DR: Coiras et al. as discussed by the authors proposed a method to estimate seafloor shape from side-scan sonar data by inversion and regularization, which can be extended to allow arbitrary vehicle motion.
Proceedings ArticleDOI
Stochastic Cloning for Robust Fusion of Multiple Relative and Absolute Measurements
TL;DR: In this article, an approach to feed back information from absolute updates to the cloned state by explicit cloning is presented and compared to existing implicit methods, which introduces a state augmentation by cloning the respective state estimates connected by a relative measurement.
Proceedings ArticleDOI
Survey on suitable 3D features for sonar-based underwater navigation
TL;DR: What type of features is suitable for sonar-based underwater navigation, and the characteristics of the reconstruction method need to be taken into account for the feature design as well as the fact that the surface will be sampled differently upon a re-visit.