R
Raghu Kacker
Researcher at National Institute of Standards and Technology
Publications - 14
Citations - 300
Raghu Kacker is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Debugging & Test strategy. The author has an hindex of 10, co-authored 14 publications receiving 269 citations.
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Proceedings ArticleDOI
Identifying Failure-Inducing Combinations in a Combinatorial Test Set
TL;DR: This paper presents an approach to identifying failure-inducing combinations, i.e., combinations that have caused some tests to fail, and shows that this approach can effectively and efficiently identify failure- inducing combinations in benchmark programs.
Journal ArticleDOI
A Combinatorial Testing-Based Approach to Fault Localization
Laleh Shikh Gholamhossein Ghandehari,Yu Lei,Raghu Kacker,D. Richard Kuhn,Tao Xie,David Chenho Kung +5 more
TL;DR: A fault localization approach, called BEN, which produces a ranking of statements in terms of their likelihood of being faulty by leveraging the result of combinatorial testing.
Journal ArticleDOI
Finding Bugs in Cryptographic Hash Function Implementations
TL;DR: This work revisits the National Institute of Standards and Technology hash function competition, which was used to develop the SHA-3 standard, and applies a new testing strategy to all available reference implementations, and develops four tests motivated by the cryptographic properties that a hash function should satisfy.
Proceedings ArticleDOI
Applying Combinatorial Testing to the Siemens Suite
Laleh Shikh Gholamhossein Ghandehari,Mehra N. Bourazjany,Yu Lei,Raghu Kacker,D. Richard Kuhn +4 more
TL;DR: The experimental results show that combinatorial testing is effective in terms of detecting most of the faulty versions with a small number of tests, and the details of the modeling process are reported, which hope to shed some lights on this critical, yet often ignored step, in the combinatorially testing process.
Proceedings ArticleDOI
Fault localization based on failure-inducing combinations
TL;DR: In this article, the authors present an approach to fault localization that leverages the result of combinatorial testing based on a notion called failure-inducing combinations, where a combination is failureinducing if it causes any test in which it appears to fail.