Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like).

Ion sources, systems and methods

The invention provides articles of manufacture comprising biocompatible nanostructures comprising nanotubes and nanopores for, e.g., organ, tissue and/or cell growth, e.g., for bone, kidney or liver growth, and uses thereof, e.g., for in vitro testing, in vivo implants, including their use in making and using artificial organs, and related therapeutics. The invention provides lock-in nanostructures comprising a plurality of nanopores or nanotubes, wherein the nanopore or nanotube entrance has a smaller diameter or size than the rest (the interior) of the nanopore or nanotube. The invention also provides dual structured biomaterial comprising micro- or macro-pores and nanopores. The invention provides biomaterials having a surface comprising a plurality of enlarged diameter nanopores and/or nanotubes.

Compositions comprising nanostructures for cell, tissue and artificial organ growth, and methods for making and using same

A method for manufacturing magnetic recording media is provided, by which a magnetic recording medium that has a recording layer formed in a concavo-convex pattern, a sufficiently flat surface, and good recording/reproducing properties can be manufactured. The method includes the steps of: depositing a first filling material over a workpiece to cover recording elements formed as convex portions of the concavo-convex pattern, and to fill at least part of a concave portion; depositing a detection material over the first filling material; depositing a second filling material over the detection material; and irradiating a surface of the workpiece with a process gas to flatten the surface. In the flattening step, a component of the detection material removed from and flying off the workpiece is detected to stop the irradiation with the process gas based on a result of detecting the component of the detection material.

Method for manufacturing magnetic recording medium

A system and method for aligning prior patterning positions formed by a first SPM tip with a second SPM tip in combination with an SPM system includes identifying first location information that includes a location of the first SPM tip and a sample reference location on an SPM sample and storing the first location information in a storage area. After replacing the first SPM tip with the second SPM tip, second location information, which includes a location of the second SPM tip and the sample reference location on the SPM sample, is identified. Displacement is calculated between the location of the second SPM tip and the first SPM tip based on the first and second location information, and either the second SPM tip or a stage supporting the SPM sample is translated to align the second SPM tip with the location of the first SPM tip in accordance with the calculated displacement.

Method and apparatus for aligning patterns on a substrate

A method and apparatus of analyzing a target system comprises receiving information relating to an environment of the target system and storing cost data based on the environment information. The plan and its estimated performance for a query may be determined based on the cost data. The environment information may pertain to the environment of a parallel system (e.g., a multi-node parallel system, a single-node parallel system having plural central processing units or a system running plural virtual processors) that is running a parallel database. The cost data may identify a number of nodes in the target system, a number of central processing units in each node of the target system, and other types of system information. The cost data may be stored in a relational table having a plurality of rows. Each row of the relational table may correspond to a different target system. The cost data is used to emulate the environment of the target system and is usable by an optimizer module to derive a query plan for an SQL (structured query language) query having the lowest (or lower) cost.

Analysis method and apparatus for a parallel system

The sensitivity of a secondary ion mass spectrometer (SIMS) is increased by using water vapor to enhance the yield of positive secondary ions sputtered by a primary focused ion beam. Water vapor is injected through a needle that is positioned close to the sample and electrically biased to reduce interference with secondary ion collection field. The sensitivity is enhanced for metals in particular, which tend to be sputtered as positive ions.

Method and apparatus for enhancing yield of secondary ions

PROBLEM TO BE SOLVED: To increase sensitivity of an SMIS systemSOLUTION: The sensitivity of a secondary ion mass spectrometer (SIMS) is increased by using steam in order to raise yield of a positive secondary ion to be sputtered by a primary convergence ion beam The steam is positioned near a sample and injected through a needle to be electrically biased in order to reduce interference with a collection field of the secondary ion The sensitivity is raised especially to metal in a tendency to be sputtered as the positive ion

Robert L. Gerlach

Papers

Method and apparatus for enhancing yield of secondary ions

Method and device for raising yield of secondary ion