R
Ron Press
Researcher at Mentor Graphics
Publications - 7
Citations - 316
Ron Press is an academic researcher from Mentor Graphics. The author has contributed to research in topics: Automatic test pattern generation & Test vector. The author has an hindex of 5, co-authored 7 publications receiving 305 citations.
Papers
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Journal ArticleDOI
High-frequency, at-speed scan testing
Xijiiang Lin,Ron Press,Janusz Rajski,P. Reuter,T. Rinderknecht,B. Swanson,Nagesh Tamarapalli +6 more
TL;DR: New strategies where at-speed scan tests can be applied with internal PLL and methodologies to combine both stuck-at-fault and delay-test vectors into an effective test suite are described.
Proceedings ArticleDOI
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality
TL;DR: A logic design for on-chip high-speed clock generation, implemented to avoid expensive test equipment, is described in detail and ATPG results for the proposed techniques are given.
Posted Content
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality
TL;DR: In this article, a logic design for on-chip high-speed clock generation, implemented to avoid expensive test equipment, is described in detail, and techniques for onchip clock generation are discussed.
Proceedings ArticleDOI
Achieving High Test Quality with Reduced Pin Count Testing
TL;DR: The RPCT technique is extended to allow application of atspeed test patterns using low cost testers that are seriously pin limited, thereby having minimal impact on the design and test area overhead.
Proceedings ArticleDOI
Measures to improve delay fault testing on low-cost testers - a case study
TL;DR: DFT techniques to increase fault coverage and to reduce pattern count are discussed, and at-speed test constraints, required to enable the delay test on low cost testers, have a significant impact on test generation results.