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Ryan Cochran

Researcher at Brown University

Publications -  10
Citations -  740

Ryan Cochran is an academic researcher from Brown University. The author has contributed to research in topics: Frequency scaling & Thread (computing). The author has an hindex of 9, co-authored 10 publications receiving 676 citations.

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Proceedings ArticleDOI

Pack & Cap: adaptive DVFS and thread packing under power caps

TL;DR: Pack & Cap is proposed, a control technique designed to make optimal DVFS and thread packing control decisions in order to maximize performance within a power budget and is implemented and validated on a real quad-core system running the PARSEC parallel benchmark suite.
Proceedings ArticleDOI

Thermal monitoring of real processors: techniques for sensor allocation and full characterization

TL;DR: This paper characterize temperature signals of real processors and demonstrates that on-chip thermal gradients lead to sparse signals in the frequency domain and devise signal reconstruction techniques that fully characterize the thermal status of the processor using the limited number of measurements from the thermal sensors.
Proceedings ArticleDOI

Consistent runtime thermal prediction and control through workload phase detection

TL;DR: An off-line analysis algorithm is devised that learns a set of thermal models as a function of operating frequency and globally defined workload phases and incorporates these thermal models into a dynamic voltage and frequency scaling (DVFS) technique that limits the maximum temperature during runtime.
Journal ArticleDOI

Improved Thermal Tracking for Processors Using Hard and Soft Sensor Allocation Techniques

TL;DR: This work proposes a hard sensor allocation algorithm to determine the sensor locations where hot spots can be tracked accurately given a budget number of sensors and proposes soft sensor computation techniques to alleviate design constraints on sensor locations and to further improve the resolution of hot spot tracking.
Proceedings ArticleDOI

Spectral techniques for high-resolution thermal characterization with limited sensor data

TL;DR: A new direction for full thermal characterization of integrated circuits based on spectral Fourier analysis techniques based on Nyquist-Shannon sampling theory is proposed and methods that can almost fully reconstruct the thermal status of an integrated circuit during runtime using a minimal number of thermal sensors are proposed.