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Ryou Mimura

Researcher at JEOL Ltd.

Publications -  2
Citations -  50

Ryou Mimura is an academic researcher from JEOL Ltd.. The author has contributed to research in topics: Focused ion beam & Ion beam. The author has an hindex of 2, co-authored 2 publications receiving 50 citations.

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Low Energy Focused Ion Beam System and Application to Low Damage Microprocess

TL;DR: In this paper, a low energy focused ion beam (FIB) system was developed by employing retarding field optics, which is equipped with a gas jet and is used for ion beam assisted etching or deposition.

Low Energy Focused Ion Beam System and Application to Low Damage Microprocess : Etching and Deposition Technology

TL;DR: In this article, a low energy focused ion beam (FIB) system was developed by employing retarding field optics, which is equipped with a gas jet and is used for ion beam assisted etching or deposition.