R
Ryou Mimura
Researcher at JEOL Ltd.
Publications - 2
Citations - 50
Ryou Mimura is an academic researcher from JEOL Ltd.. The author has contributed to research in topics: Focused ion beam & Ion beam. The author has an hindex of 2, co-authored 2 publications receiving 50 citations.
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Low Energy Focused Ion Beam System and Application to Low Damage Microprocess
TL;DR: In this paper, a low energy focused ion beam (FIB) system was developed by employing retarding field optics, which is equipped with a gas jet and is used for ion beam assisted etching or deposition.
Low Energy Focused Ion Beam System and Application to Low Damage Microprocess : Etching and Deposition Technology
TL;DR: In this article, a low energy focused ion beam (FIB) system was developed by employing retarding field optics, which is equipped with a gas jet and is used for ion beam assisted etching or deposition.