S
S. London
Researcher at Telcordia Technologies
Publications - 10
Citations - 1992
S. London is an academic researcher from Telcordia Technologies. The author has contributed to research in topics: Fault coverage & Fault detection and isolation. The author has an hindex of 10, co-authored 10 publications receiving 1921 citations.
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Proceedings ArticleDOI
A study of effective regression testing in practice
TL;DR: This proposed hybrid technique combines modification, minimization and prioritization-based selection using a list of source code changes and the execution traces from test cases run on previous versions to identify a representative subset of all test cases that may result in different output behavior on the new software version.
Proceedings ArticleDOI
Fault localization using execution slices and dataflow tests
TL;DR: A tool which supports execution slicing and dicing based on test cases is described and an experiment that uses heuristic techniques in fault localization is reported.
Proceedings ArticleDOI
Incremental regression testing
TL;DR: The purpose of regression testing is to ensure that bug fixes and new functionality introduced in a new version of a software do not adversely affect the correct functionality inherited from the previous version.
Proceedings ArticleDOI
Effect of test set minimization on fault detection effectiveness
TL;DR: An empirical study using the block and all-uses criteria as the coverage measures to address the issue of whether the size of T or the coverage of T on P determines the fault detection effectiveness of T for P.
Journal ArticleDOI
Effect of test set minimization on fault detection effectiveness
TL;DR: As the size of a test set is reduced, while the code coverage is kept constant, there is little or no reduction in the fault detection effectiveness of the new test set so generated.