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S

S. London

Researcher at Telcordia Technologies

Publications -  10
Citations -  1992

S. London is an academic researcher from Telcordia Technologies. The author has contributed to research in topics: Fault coverage & Fault detection and isolation. The author has an hindex of 10, co-authored 10 publications receiving 1921 citations.

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Proceedings ArticleDOI

A study of effective regression testing in practice

TL;DR: This proposed hybrid technique combines modification, minimization and prioritization-based selection using a list of source code changes and the execution traces from test cases run on previous versions to identify a representative subset of all test cases that may result in different output behavior on the new software version.
Proceedings ArticleDOI

Fault localization using execution slices and dataflow tests

TL;DR: A tool which supports execution slicing and dicing based on test cases is described and an experiment that uses heuristic techniques in fault localization is reported.
Proceedings ArticleDOI

Incremental regression testing

TL;DR: The purpose of regression testing is to ensure that bug fixes and new functionality introduced in a new version of a software do not adversely affect the correct functionality inherited from the previous version.
Proceedings ArticleDOI

Effect of test set minimization on fault detection effectiveness

TL;DR: An empirical study using the block and all-uses criteria as the coverage measures to address the issue of whether the size of T or the coverage of T on P determines the fault detection effectiveness of T for P.
Journal ArticleDOI

Effect of test set minimization on fault detection effectiveness

TL;DR: As the size of a test set is reduced, while the code coverage is kept constant, there is little or no reduction in the fault detection effectiveness of the new test set so generated.