S. M. Chaudhari

TL;DR: In this paper, the variation in the film properties as a function of the substrate temperature and oxygen partial pressure during deposition was studied, and conversion electron Mossbauser spectroscopic analysis showed that the stoichiometry and microstructure of such films depend on these deposition conditions.

TL;DR: Amorphous carbon films have been deposited on silicon and quartz substrates by pulsed ruby laser vaporization from pyrolytic graphite, and the properties of the deposited carbon films were studied using IR and UV-VIS transmission, ellipsometry, and laser-Raman spectroscopies as mentioned in this paper.

TL;DR: Ion-beam-induced atomic mixing and the effect of thermally activated transformations at the Fe-Al interface have been studied for the first time with use of the technique of conversion-electron 57 Fe Mossbauer spectroscopy (CEMS).

TL;DR: In this paper, a single-phase SnO2 film was found to have an energy gap of 3.5 eV and spectroscopic ellipsometry measurements indicated the refractive index lobe typically between 1.8-1.9 over the wavelength range of 400-800 nm.

TL;DR: In this paper, the dependence of the film properties on laser energy density, oxygen partial pressure during deposition and substrate bias has been investigated and optimum conditions have been brought out for obtaining single phase stoichiometric thin films.