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S. Solntsev

Researcher at Delft University of Technology

Publications -  18
Citations -  362

S. Solntsev is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Silicon & Plasmonic solar cell. The author has an hindex of 9, co-authored 18 publications receiving 352 citations.

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Modelling of thin-film silicon solar cells

TL;DR: In this paper, a three-dimensional Maxwell equation solver was used to analyze and optimize periodic textures when embedded in single and multi-junction solar cells, in both random and periodic cases, opto-electrical modelling was employed to assess the spectral response, to evaluate optical losses and to simulate current density and voltage characteristic.
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3‐D optical modeling of thin‐film silicon solar cells on diffraction gratings

TL;DR: In this paper, an effective rigorous 3-D optical modeling of thin-film silicon solar cells based on finite element method (FEM) is presented, which is used to validate a commercial FEM-based package, the High Frequency Structure Simulator (HFSS).
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Advanced Light Management Approaches for Thin-Film Silicon Solar Cells

TL;DR: In this paper, a model of light scattering at textured surfaces, which is based on first order Born approximation and the Fraunhofer diffraction, is presented, and an example of a three-dimensional simulation, employing the finite element method, of an amorphous silicon solar cell with periodically textured interfaces is shown.
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Accurate opto-electrical modeling of multi-crystalline silicon wafer-based solar cells

TL;DR: In this article, an accurate opto-electrical modeling of multi-crystalline silicon solar cells is presented, where the optical model describes light scattering due to wafer texturing, the electrical modeling of heavily doped emitter and the optoelectrical modelling of the back surface field.
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Optical modeling of thin-film silicon solar cells with submicron periodic gratings and nonconformal layers

TL;DR: In this paper, the authors used the results of atomic force microscopy (AFM) measurements to define the morphology of interfaces between the layers of thin-film silicon solar cells and determined an optimum smoothing of interface roughness.