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S. Vepřek

Researcher at Technische Universität München

Publications -  47
Citations -  3293

S. Vepřek is an academic researcher from Technische Universität München. The author has contributed to research in topics: Nanocrystalline material & Silicon. The author has an hindex of 22, co-authored 47 publications receiving 3185 citations.

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A concept for the design of novel superhard coatings

TL;DR: In this article, a concept for the design of novel nanocrystalline/amorphous composites is suggested based on recent theoretical and experimental results regarding the appearance of supermodulus phenomena in composition-modulated layered heterostructures and on a simple thermodynamic criterion for segregation in ternary nitride systems.
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Superhard nanocrystalline composite materials: The TiN/Si3N4 system

TL;DR: In this article, thin films of novel superhard composite materials consisting of TiN nanocrystals in an amorphous Si3N4 matrix have been prepared by means of plasma chemical vapor deposition.
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Recent progress in the superhard nanocrystalline composites : towards their industrialization and understanding of the origin of the superhardness

TL;DR: In this article, a combined plasma CVD and PVD technique was developed for the deposition of superhard nc-TiN/c-BN nanocomposites, which reached 70 GPa and elastic modulus E/(1-ν 2 )≈585 GPa.
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Novel thermodynamically stable and oxidation resistant superhard coating materials

TL;DR: In this paper, a theoretical concept for the design of novel, nanocrystalline and thermodynamically stable materials with hardness of ≥50 GPa (about 5000 kg mm−2), elastic modulus of ≥500 GPa and a high stability against oxidation in air up to 800°C is described together with its experimental verification on several systems nc-MexN/a-Si3N4 (Me  Ti, W, V).
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Structural properties, internal stress and thermal stability of nc-TiN/a-Si3N4, nc-TiN/TiSix and nc-(Ti1−yAlySix)N superhard nanocomposite coatings reaching the hardness of diamond

TL;DR: The average crystallite size, d, in the range of about 3-8nm determined from XRD by means of the Scherrer formula and integral width of the Bragg peaks compares well with that determined from the Warren-Averbach analysis as discussed by the authors.