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Sarma Vrudhula

Researcher at Arizona State University

Publications -  217
Citations -  8848

Sarma Vrudhula is an academic researcher from Arizona State University. The author has contributed to research in topics: Logic gate & CMOS. The author has an hindex of 48, co-authored 208 publications receiving 8050 citations. Previous affiliations of Sarma Vrudhula include Texas A&M University & University of Arizona.

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Proceedings ArticleDOI

Throughput-Optimized OpenCL-based FPGA Accelerator for Large-Scale Convolutional Neural Networks

TL;DR: This work presents a systematic design space exploration methodology to maximize the throughput of an OpenCL-based FPGA accelerator for a given CNN model, considering the FPGAs resource constraints such as on-chip memory, registers, computational resources and external memory bandwidth.
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Battery modeling for energy aware system design

TL;DR: Research in battery-aware optimization is now moving from stand-alone devices to networks of wireless devices, specifically, ad hoc and distributed sensor networks.
Proceedings ArticleDOI

Predictive Modeling of the NBTI Effect for Reliable Design

TL;DR: This paper presents a predictive model for the negative bias temperature instability (NBTI) of PMOS under both short term and long term operation based on the reaction-diffusion (R-D) mechanism, which accurately captures the dependence of NBTI on the oxide thickness, the diffusing species and other key transistor and design parameters.
Proceedings ArticleDOI

Optimizing Loop Operation and Dataflow in FPGA Acceleration of Deep Convolutional Neural Networks

TL;DR: This work systematically explore the trade-offs of hardware cost by searching the design variable configurations, and proposes a specific dataflow of hardware CNN acceleration to minimize the memory access and data movement while maximizing the resource utilization to achieve high performance.
Journal ArticleDOI

The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis

TL;DR: This paper develops a hierarchical framework for analyzing the impact of NBTI on the performance of logic circuits under various operation conditions, such as the supply voltage, temperature, and node switching activity, and proposes an efficient method to predict the degradation of circuit speed over a long period of time.