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Shigeki Nishina
Researcher at Advantest
Publications - 22
Citations - 69
Shigeki Nishina is an academic researcher from Advantest. The author has contributed to research in topics: Terahertz radiation & Electromagnetic radiation. The author has an hindex of 5, co-authored 22 publications receiving 64 citations.
Papers
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Proceedings ArticleDOI
3D Imaging and analysis system using terahertz waves
TL;DR: The 3D Imaging Analysis System (3DIA) as mentioned in this paper uses terahertz waves for non-destructive analysis of the spatial distribution of constituents, which is the first such system for practical applications.
Proceedings ArticleDOI
3D Spectroscopic computed tomography imaging using terahertz waves
TL;DR: In this paper, a three-dimensional spectroscopic imaging system that uses terahertz waves and is based on transmission computed tomography was developed, which is used for high refractive index objects with identification of chemical components.
Patent
Electromagnetic wave measuring apparatus, measuring method, program and recording medium
TL;DR: In this article, a relative position changer is used to change the relative position of an intersection of an optical path of the electromagnetic wave transmitted through the device under test and the device with respect to it, so that the intersection is at a predetermined relative position.
Journal ArticleDOI
Novel Nondestructive Imaging Analysis for Catalyst Washcoat Loading and DPF Soot Distribution Using Terahertz Wave Computed Tomography
Shigeki Nishina,Kunio Takeuchi,Makoto Shinohara,Motoki Imamura,Masahito Shibata,Yoshihito Hashimoto,Futoshi Watanabe +6 more
Proceedings ArticleDOI
Failure analysis of LSI interconnection by terahertz time-domain reflectometry
Masaichi Hashimoto,Takanori Okada,Shigeki Nishina,Tsuyoshi Ataka,Makoto Shinohara,Yasuhide Maehara,Akiyoshi Irisawa,Motoki Imamura +7 more
TL;DR: In this paper, the authors developed a time-domain reflectometry technology with extremely small distance-to-fault measurement error less than 50 μm, which includes X-ray length measuring error, by introducing pulsed terahertz probing signal to Quad Flat Package.