When mirror-polished, flat, and clean wafers of almost any material are brought into contact at room temperature, they are locally attracted to each other by van der Waals forces and adhere or bond. This phenomenon is referred to as wafer bonding. The most prominent applications of wafer bonding are silicon-on-insulator (SOI) devices, silicon-based sensors and actuators, as well as optical devices. The basics of wafer-bonding technology are described, including microcleanroom approaches, prevention of interface bubbles, bonding of III-V compounds, low-temperature bonding, ultra-high vacuum bonding, thinning methods such as smart-cut procedures, and twist wafer bonding for compliant substrates. Wafer bonding allows a new degree of freedom in design and fabrication of material combinations that previously would have been excluded because these material combinations cannot be realized by the conventional approach of epitaxial growth.

Semiconductor wafer bonding

Wafer-to-wafer bonding processes for microstructure fabrication are categorized and described. These processes have an impact in packaging and structure design. Processes are categorized into direct bonds, anodic bonds, and bonds with intermediate layers. Representative devices using wafer-to-wafer bonding are presented. Processes and methods for characterization of a range of bonding methods are discussed. Opportunities for continued development are outlined.

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Wafer-to-wafer bonding for microstructure formation

It is a well-known phenomenon that two solids with sufficiently flat surfaces can stick to each other when brought into intimate contact in ambient air at room temperature. The attraction between the two bodies is primarily mediated through van der Waals forces or hydrogen bonding. Without a subsequent heating step, that type of bonding is reversible. Annealing may increase the energy of adhesion up to the cohesive strength of the materials concerned. The wafer bonding phenomena in brittle materials systems, especially in silicon, is reviewed in the experiment. The focus is on low temperature bonding techniques. The pivotal influence chemical species on the surfaces have on the subsequent type of bonding (van der Waals, hydrogen, covalent bonding, mechanical interlocking) is discussed. Methods of modifying the surface chemistry for tailoring bonding properties are addressed. The paper is aimed at providing an overview of the current understanding of the factors determining the bondability and strength of the bonding obtainable. The authors assess the present state of the experimental methods for determining basic parameters governing the adhesion. A number of examples illustrate the applicability of fusion bonding for as diverse fields as opto-electronics, microsystems technology, and fabrication of advanced substrates like silicon-on-insulator wafers.

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Wafer direct bonding: tailoring adhesion between brittle materials

Thin copper (Cu) films of 80 nm thickness deposited on a diffusion barrier layered 8 in. silicon wafers were directly bonded at room temperature using the surface activated bonding method. A low energy Ar ion beam of 40–100 eV was used to activate the Cu surface prior to bonding. Contacting two surface-activated wafers enables successful Cu–Cu direct bonding. The bonding process was carried out under an ultrahigh vacuum condition. No thermal annealing was required to increase the bonding strength since the bonded interface was strong enough at room temperature. The chemical constitution of the Cu surface was examined by Auger electron spectroscope. It was observed that carbon-based contaminations and native oxides on copper surface were effectively removed by Ar ion beam irradiation for 60 s without any wet cleaning processes. An atomic force microscope study shows that the Ar ion beam process causes no surface roughness degradation. Tensile test results show that high bonding strength equivalent to bulk ...

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Room temperature Cu-Cu direct bonding using surface activated bonding method

A large number of novel devices have been recently demonstrated using wafer fusion to integrate materials with different lattice constants. In many cases, devices created using this technique have shown dramatic improvements over those which maintain a single lattice constant. We present device results and characterizations of the fused interface between several groups of materials.

Stefan Bengstsson

Papers

Semiconductor wafer bonding: a review of interfacial properties and applications