Showing papers by "Stephen W.S. McKeever published in 1992"
TL;DR: In this article, a comparison of etch pit densities showed that the SPVT material has few defects and no grain boundaries while the Bridgman material shows both low and high angle grain boundaries.
Abstract: Crystallographic and optical characterization techniques were carried out on ZnSe single‐crystal samples grown by the seeded physical vapor transport (SPVT) and by high‐pressure Bridgman techniques. A comparison of etch pit densities shows much lower values for the SPVT material. The distribution of etch pits across a wafer is uniform in SPVT samples but extremely nonuniform in the Bridgman samples. X‐ray topography studies reveal that the SPVT material has few defects and no grain boundaries while the Bridgman material shows both low and high angle grain boundaries. Photoluminescence (PL) data at 12 K on the SPVT material reveal an absence of donor acceptor pair (DAP) emissions. The spectrum is dominated by the Id1 Cu‐related line and its phonon replicas and only weak Cug and Cur emissions are observed. No thermoluminescence (TL) is seen from the SPVT samples but they do give thermally stimulated conductivity (TSC) signals due to the release of holes from CuZn centers with activation energies of 0.33 eV ...
81 citations