S
Stuart O. Nelson
Researcher at United States Department of Agriculture
Publications - 327
Citations - 9130
Stuart O. Nelson is an academic researcher from United States Department of Agriculture. The author has contributed to research in topics: Dielectric & Moisture. The author has an hindex of 51, co-authored 326 publications receiving 8567 citations. Previous affiliations of Stuart O. Nelson include University of Georgia & Agricultural Research Service.
Papers
More filters
Journal ArticleDOI
Review and Assessment of Radio-frequency and Microwave Energy for Stored-grain Insect Control
TL;DR: In this article, fundamental principles of radiofrequency and microwave dielectric heating are presented, with a basic consideration of differential or selective absorption of energy from RF and microwave fields that might be applicable for stored-grain insect control.
Journal ArticleDOI
Dielectric properties of agricultural products-measurements and applications
TL;DR: In this paper, the nature of the variation of dielectric properties with frequency, temperature, and product density is discussed, and graphical data on the dielectrics properties of grain and soybeans as functions of moisture content, frequency and temperature and bulk of density are presented.
Journal ArticleDOI
Free-space measurement of dielectric properties of cereal grain and oilseed at microwave frequencies
S. Trabelsi,Stuart O. Nelson +1 more
TL;DR: In this article, the authors present a system including a vector network analyser, horn/lens antennas, holder for grain and oilseed samples and a radiation absorbing enclosure that was used for such measurements, and the techniques and procedures followed to obtain reliable permittivity data for wheat, shelled corn (maize) and soybeans are outlined.
Journal ArticleDOI
New density-independent calibration function for microwave sensing of moisture content in particulate materials
TL;DR: A new approach is presented in which both bulk density and moisture content are determined directly from measured microwave dielectric properties, and this new approach remains valid in general for other techniques, provided that /spl epsiv/' and /spl Epsiv/" are determined accurately.