T
T.K. Young
Publications - 1
Citations - 43
T.K. Young is an academic researcher. The author has contributed to research in topics: Electromigration. The author has an hindex of 1, co-authored 1 publications receiving 43 citations.
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Electromigration: the time bomb in deep-submicron ICs
Ping-Chung Li,T.K. Young +1 more
TL;DR: In this paper, the authors describe how electromigration is a ticking time bomb in IC designs, which can trigger a system failure at some undefined future time, particularly likely to afflict the thin, tightly spaced power-distribution lines of deep-submicron designs.