T
T.M. Butler
Researcher at Air Force Research Laboratory
Publications - 24
Citations - 969
T.M. Butler is an academic researcher from Air Force Research Laboratory. The author has contributed to research in topics: Microstructure & Alloy. The author has an hindex of 12, co-authored 19 publications receiving 565 citations. Previous affiliations of T.M. Butler include Wright-Patterson Air Force Base & University of Alabama.
Papers
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Oxidation behavior of arc melted AlCoCrFeNi multi-component high-entropy alloys
T.M. Butler,Mark L. Weaver +1 more
TL;DR: In this article, the as-cast microstructures and 1050°C oxidation behaviors of a series of arc-melted Al x (NiCoCrFe) 100-x HEAs where x = 8, 10, 12, 15, 20, and 30 (at.
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High-Temperature Oxidation Behavior of Al-Co-Cr-Ni-(Fe or Si) Multicomponent High-Entropy Alloys
TL;DR: In this paper, the microstructures and 1050°C oxidation behaviors of two high-entropy alloys, Al10Cr22.5Co22Ni 22.5Fe and Al20Cr25Co25Ni25Si5 have been investigated along with Al15Cr10Co35Ni35Si5, which is a high-temperature shapememory alloy.
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High temperature oxidation behaviors of equimolar NbTiZrV and NbTiZrCr refractory complex concentrated alloys (RCCAs)
TL;DR: In this article, a systematic evaluation of refractory complex concentrated alloys (RCCAs) was conducted to understand the oxidation mechanisms in these types of alloys, and novel design strategies for promoting increased oxidation resistance in both RCCAs and dilute refractor alloys based on sluggish complex oxides were proposed.
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Investigation of the phase stabilities in AlNiCoCrFe high entropy alloys
T.M. Butler,Mark L. Weaver +1 more
TL;DR: In this article, the phase equilibria and phase stabilities of a series of AlNiCoCrFe-based high-entropy alloys were investigated using the CALPHAD model.
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Crystallography, compositions, and properties of white layer by wire electrical discharge machining of nitinol shape memory alloy
TL;DR: In this paper, a comprehensive investigation on the crystallography, compositions, and properties of the white layer using transmission electron microscopy, X-ray diffraction, electron backscatter diffraction (EBSD), and nanoindentation was conducted.