A fast-Fourier-transform method of topography and interferometry is proposed. By computer processing of a noncontour type of fringe pattern, automatic discrimination is achieved between elevation and depression of the object or wave-front form, which has not been possible by the fringe-contour-generation techniques. The method has advantages over moire topography and conventional fringe-contour interferometry in both accuracy and sensitivity. Unlike fringe-scanning techniques, the method is easy to apply because it uses no moving components.

Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

Principle and application of phase-shifting electron holography

Quantitative TEM-based phase retrieval of MgO nano-cubes using the transport of intensity equation.

https://phyweb.physics.nus.edu.sg/~phybcb/publications/pdf/229%20K2%20holo%20phase%20noise%20Apr%202015.pdf

Performance of a direct detection camera for off-axis electron holography.

Off-axis electron holography combining summation of hologram series with double-exposure phase-shifting: Theory and application.

A phase‐shifting method to directly measure the amplitude and phase distribution of specimen in an electron holographic microscope without the introduction of large number of carrier fringes is proposed. The initial phase of electron holograms is shifted by tilting the incident electron beam with a digital voltage/current supply. Several holograms of a specimen with properly different phase shifts are recorded digitally and used to calculate the amplitude and phase distributions of the specimen. Experimental result of observing the phase distribution of a cubic MgO crystal is shown.

T. Tanji

Papers

Phase‐shifting electron holography by beam tilting