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Tae Won Kim

Researcher at General Electric

Publications -  9
Citations -  319

Tae Won Kim is an academic researcher from General Electric. The author has contributed to research in topics: Coating & Substrate (printing). The author has an hindex of 7, co-authored 9 publications receiving 309 citations.

Papers
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Journal ArticleDOI

Transparent hybrid inorganic/organic barrier coatings for plastic organic light-emitting diode substrates

TL;DR: In this paper, a single hybrid layer of inorganic and organic materials is used to reduce the moisture permeation rate through a polycarbonate plastic film substrate to below 1×10−5g∕m2∕day using plasma-enhanced chemical vapor deposition.
Journal ArticleDOI

Ultrahigh barrier coating deposition on polycarbonate substrates

TL;DR: In this paper, it was shown that through the application of thin, dense, plasma-based inorganic coatings, one can significantly reduce the oxygen and moisture permeation rate through polycarbonate films.
Journal ArticleDOI

A Transparent, High Barrier, and High Heat Substrate for Organic Electronics

TL;DR: The development and performance of a plastic substrate comprising a high heat polycarbonate film combined with a unique transparent coating package that is aimed at meeting the challenge of optical transparency, impermeability to water and oxygen, mechanical flexibility, high-temperature capability, and chemical resistance are described.
Patent

High integrity protective coatings

TL;DR: In this article, a composite article with at least one high integrity protective coating, the high integrity protecting coating having at least a planarizing layer and at least an organic-inorganic composition barrier layer, is presented.
Patent

Multilayer device and method of making

TL;DR: In this paper, a composite article comprising a substrate and additional layers on the substrate is selected so that the difference in the coefficient of thermal expansion (CTE) between the substrate and a first layer on one side of a substrate is substantially equal to the CTE difference between a second layer on the other side of the substrate.