T
Takehisa Yahiro
Researcher at Nikon
Publications - 33
Citations - 221
Takehisa Yahiro is an academic researcher from Nikon. The author has contributed to research in topics: Reticle & Charged particle beam. The author has an hindex of 8, co-authored 33 publications receiving 214 citations.
Papers
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Proceedings ArticleDOI
Nikon EB stepper: its system concept and countermeasures for critical issues
Kazuaki Suzuki,Tomoharu Fujiwara,Kazunari Hada,Noriyuki Hirayanagi,Shintaro Kawata,Kenji Morita,Kazuya Okamoto,Teruaki Okino,Sumito Shimizu,Takehisa Yahiro +9 more
TL;DR: Nikon EB stepper's dynamic writing strategy of discrete exposure on a sub-field by subfield basis with deflection control of the electron beam is explained in this article, where the basic system configuration of EB steppers is introduced.
Patent
Projection-microlithography apparatus, masks, and related methods incorporating reticle-distortion measurement and correction
TL;DR: In this article, the authors disclosed the segmented reticles used with a charged particle-beam projection-microlithography apparatus, which consisted of multiple mask subfields and a support grid of intersecting struts.
Patent
Methods for determining focus and astigmatism in charged-particle-beam microlithography
Wakako Suganuma,Takehisa Yahiro +1 more
TL;DR: In this paper, a subfield containing an evaluation pattern is subdivided into multiple regions, and the respective line-and-space (L/S) pattern elements are oriented such that the elements in one region extend in a direction that intersects the direction, in the object plane of orientation of the pattern element in another region.
Patent
Charged-particle-beam microlithographic methods for correction of reticle distortions
TL;DR: In this paper, a reticle is segmented into multiple exposure units grouped into stripes, and peripheral exposure units define second alignment marks for measuring reticle distortion arising from loading the reticle in the CPB projection-exposure apparatus.
Patent
Devices for measuring and adjusting illumination uniformity obtained from a charged-particle illumination-optical system
TL;DR: In this article, the adjustments of illumination uniformity obtained from a charged-particle illumination-optical system as used, e.g., in a chargedparticle-beam (CPB) microlithography apparatus are described.