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Thanasis Vafeiadis
Researcher at Information Technology Institute
Publications - 32
Citations - 735
Thanasis Vafeiadis is an academic researcher from Information Technology Institute. The author has contributed to research in topics: Computer science & Predictive maintenance. The author has an hindex of 10, co-authored 29 publications receiving 412 citations. Previous affiliations of Thanasis Vafeiadis include Aristotle University of Thessaloniki.
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Journal ArticleDOI
A comparison of machine learning techniques for customer churn prediction
TL;DR: A comparative study on the most popular machine learning methods applied to the challenging problem of customer churning prediction in the telecommunications industry demonstrates clear superiority of the boosted versions of the models against the plain (non-boosted) versions.
Journal ArticleDOI
Industry 4.0 sustainable supply chains: An application of an IoT enabled scrap metal management solution
Theofilos D. Mastos,Alexandros Nizamis,Thanasis Vafeiadis,Nikolaos D. Alexopoulos,Christos Ntinas,Dimitrios Gkortzis,Angelos Papadopoulos,Dimosthenis Ioannidis,Dimitrios Tzovaras +8 more
TL;DR: In this paper, a case study from a scrap metal producer that operates in the lift industry and a waste management company is presented, in order to illustrate how the deployment of a state-of-the-art industry 4.0 solution has the potential to improve sustainability both in the firm level and in the supply chain level.
Journal ArticleDOI
A framework for inspection of dies attachment on PCB utilizing machine learning techniques
Thanasis Vafeiadis,Nikolaos Dimitriou,Dimosthenis Ioannidis,Tracy Wotherspoon,Gregory Tinker,Dimitrios Tzovaras +5 more
TL;DR: A schema of Monte Carlo simulations for each classification algorithm and set of hyper-parameters was performed and results show a superiority of the support vector machine (SVM) classifier with polynomial and radial basis function kernels, compared to the rest.
Journal ArticleDOI
Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans
Nikolaos Dimitriou,Lampros Leontaris,Thanasis Vafeiadis,Dimosthenis Ioannidis,Tracy Wotherspoon,Gregory Tinker,Dimitrios Tzovaras +6 more
TL;DR: This article proposes a system that automates fault diagnosis by accurately estimating the volume of glue deposits before and even after die attachment using (R)egression-Net (RNet), a three-dimensional (3-D) convolutional neural network (3DCNN).
Proceedings ArticleDOI
Machine Learning Based Occupancy Detection via the Use of Smart Meters
Thanasis Vafeiadis,S. Zikos,Georgios Stavropoulos,Dimosthenis Ioannidis,Stelios Krinidis,D. Tzovaras,Konstantinos Moustakas +6 more
TL;DR: The authors' simulation results show a superiority of Random Forest learning technique compared to the other classification techniques with accuracy slightly over 80% and F-measure with almost 84%, respectively.