T
Thomas J. Silva
Researcher at National Institute of Standards and Technology
Publications - 192
Citations - 11850
Thomas J. Silva is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Magnetization & Ferromagnetic resonance. The author has an hindex of 53, co-authored 189 publications receiving 10669 citations. Previous affiliations of Thomas J. Silva include University of California, San Diego & University of California.
Papers
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Journal ArticleDOI
Mutual phase-locking of microwave spin torque nano-oscillators
Shehzaad Kaka,Matthew R. Pufall,William H. Rippard,Thomas J. Silva,Stephen E. Russek,Jordan A. Katine +5 more
TL;DR: It is shown that two STNOs in close proximity mutually phase-lock—that is, they synchronize, which is a general tendency of interacting nonlinear oscillator systems.
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Direct-current induced dynamics in Co90 Fe10/Ni80 Fe20 point contacts.
TL;DR: In this paper, the authors directly measured coherent high-frequency magnetization dynamics in ferromagnetic films induced by a spin-polarized dc current, which can be tuned over a range of several gigahertz by varying the applied current.
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Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods
Sangita S. Kalarickal,Pavol Krivosik,Mingzhong Wu,Carl E. Patton,Michael L. Schneider,Pavel Kabos,Thomas J. Silva,John P. Nibarger +7 more
TL;DR: In this paper, the linewidth of a series of Permalloy films with thicknesses of 50 and 100nm was measured using linear function of frequency, with a slope that corresponds to a nominal Landau-Lifshitz phenomenological damping parameter α value of 0.007 and zero frequency intercepts in the 160-320A∕m (2-4Oe) range.
Journal Article
Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods | NIST
Sangita S. Kalarickal,Pavol Krivosik,Mingzhong Wu,Carl E. Patton,Michael Schneider,Pavel Kabos,Thomas J. Silva,John P. Nibarger +7 more
TL;DR: In this article, the linewidth of a series of Permalloy films with thicknesses of 50 and 100nm was measured using linear function of frequency, with a slope that corresponds to a nominal Landau-Lifshitz phenomenological damping parameter α value of 0.007 and zero frequency intercepts in the 160-320A∕m (2-4Oe) range.
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Inductive measurement of ultrafast magnetization dynamics in thin-film Permalloy
TL;DR: In this article, an inductive technique for the measurement of dynamical magnetic processes in thin-film materials is described using 50 nm films of Permalloy (Ni81Fe19) and data are presented for impulse and step-response experiments with the applied field pulse oriented in the plane of the film and transverse to the anisotropy axis.