Showing papers by "Tolek Tyliszczak published in 1994"

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Journal Article•DOI•

Polarization dependence of the Si K-edge X-ray absorption spectra of Si-Ge atomic layer superlattices

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Adam P. Hitchcock¹, Tolek Tyliszczak¹, P. Aebi¹, X.H. Feng², Z.H. Lu³, J.-M. Baribeau³, T. E. Jackman³ - Show less +3 more•Institutions (3)

McMaster University¹, University of Wisconsin-Madison², National Research Council³

10 Jan 1994-Surface Science

TL;DR: In this article, a constrained curve fit analysis of up to eight data files simultaneously has been used to quantitatively analyze the signal, attributed to anisotropic states associated with strain-induced tetragonal distortions in the strained-ALS materials.

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9 citations