T
Tullio Rozzi
Researcher at Marche Polytechnic University
Publications - 119
Citations - 835
Tullio Rozzi is an academic researcher from Marche Polytechnic University. The author has contributed to research in topics: Dielectric & Equivalent circuit. The author has an hindex of 16, co-authored 119 publications receiving 803 citations.
Papers
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Journal ArticleDOI
Rigorous analysis of the GTEM cell
TL;DR: In this paper, the longitudinal field distribution of a GTEM cell with an eccentric sloping plate conductor is derived by transverse resonance diffraction. But the results show that the structure to be actually overmoded rather than quasi-TEM.
Journal ArticleDOI
Disentangling time in a near-field approach to scanning probe microscopy.
Marco Farina,Agnese Lucesoli,Tiziana Pietrangelo,Andrea Di Donato,Silvia Fabiani,Giuseppe Venanzoni,Davide Mencarelli,Tullio Rozzi,Antonio Morini +8 more
TL;DR: It is shown that examining the time evolution of the electromagnetic waves allows us to disentangle each contribution, providing images with striking quality and unexplored scenarios for near-field microscopy.
Journal ArticleDOI
Hybrid modes, substrate leakage, and losses of slotline at millimeter-wave frequencies
TL;DR: In this paper, a variational solution of a singular integral equation for an E, field tangential to the slot is analyzed for hybrid propagation in a slotline at microwave and millimeter-wave frequencies.
Journal ArticleDOI
Accurate full-band equivalent circuits of inductive posts in rectangular waveguide
TL;DR: In this article, a rigorous wideband model, including near-neighbor interaction, that is suitable for accurate filter synthesis and CAD by means of a desk-top computer is developed.
Proceedings ArticleDOI
Broadband Scanning Microwave Microscopy investigation of graphene
Silvia Fabiani,Davide Mencarelli,Andrea Di Donato,Tamara Monti,Giuseppe Venanzoni,Antonio Morini,Tullio Rozzi,Marco Farina +7 more
TL;DR: In this paper, a dual-channel probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and Wide-band Near Field Scanning Microwave MicroScopy (wide-band SMM) was applied to a graphene flake.