V
Vladimir A. Lobastov
Researcher at General Electric
Publications - 38
Citations - 2145
Vladimir A. Lobastov is an academic researcher from General Electric. The author has contributed to research in topics: Ultrafast electron diffraction & Detector. The author has an hindex of 17, co-authored 38 publications receiving 2037 citations. Previous affiliations of Vladimir A. Lobastov include California Institute of Technology.
Papers
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Journal ArticleDOI
Direct imaging of transient molecular structures with ultrafast diffraction.
Hyotcherl Ihee,Vladimir A. Lobastov,Udo M. Gomez,Boyd M. Goodson,Ramesh Srinivasan,Chong-Yu Ruan,Ahmed H. Zewail +6 more
TL;DR: This direct imaging of reactions was achieved using the third-generation apparatus equipped with an electron pulse, a charge-coupled device camera, and a mass spectrometer to demonstrate the vastly improved sensitivity, resolution, and versatility of UED for studying ultrafast structural dynamics in complex molecular systems.
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Four-dimensional ultrafast electron microscopy
TL;DR: The development of 4D ultrafast electron microscopy is reported, whose capability imparts another dimension to imaging in general and to dynamics in particular, and is demonstrated by recording images and diffraction patterns of crystalline and amorphous materials and images of biological cells.
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Ultrafast Electron Crystallography of Interfacial Water
TL;DR: The structures were determined to be dominantly cubic, but each undergoes different dynamics after the ultrafast substrate temperature jump, and changes in local bond distances with time elucidated the structural changes in the far-from-equilibrium regime at short times and near-equilibration at long times.
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Ultrafast electron diffraction (UED) a new development for the 4D determination of transient molecular structures
TL;DR: In this paper, the authors highlight the advances made at Caltech, with emphasis on the principles of UED, its evolution through four generations of instrumentation (UED-1 to UED-4) and its diverse applications.
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Ultrafast electron crystallography: Transient structures of molecules, surfaces, and phase transitions
TL;DR: The sensitivity achieved here, with the 6 orders of magnitude larger cross section than x-ray diffraction, and with the capabilities of combined spatial ( approximately 0.01 A) and temporal (300-600 fs) resolutions, promise diverse applications for this ultrafast electron crystallography tabletop methodology.