Review of Charged Particle Dynamics. Beam Optics and Focusing Systems Without Space Charge. Linear Beam Optics with Space Charge. Self-Consistent Theory of Beams. Emittance Variation. Beam Physics Research from 1993 to 2007. Appendices. List of Frequently Used Symbols. Bibliography. Index.

Theory and Design of Charged Particle Beams

Mes premiers remtrciements trout aux auteurs des 206 communications th6matiquts et notes de projet, sans qui ces actes n'auraient 6videmment pas vu le jour. / Is oat contribu6 h la qualit6 scientifique et ,5 I'hmuog6t~6it6 pr6sentationntlle de leurs articles en refondant les versions iuitiales soumises an comit6 de programme, ea acceptant de suivre les r~gles de pr6sentation indiqu6es, et en nous envoyant parrots plusieurs versions am61ior6es surun point ou sur l'autrc.

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About these proceedings

A free-space measurement system operating in the 8.2-40-GHz frequency range is used to measure the reflection and transmission coefficients, S/sub 11/ and S/sub 21/, of planar samples. The complex electric permittivity and the magnetic permeability are calculated from the measured values of S/sub 11/ and S/sub 21/. The measurement system consists of transmit and receive horn lens antennas, a network analyzer, mode transitions, and a computer. Diffraction effects at the edges of the sample are minimized by using spot-focusing lens antennas. Errors due to multiple reflections between antennas via the surface of the sample are corrected by using a free-space TRL (thru, reflect, line) calibration technique. For thin, flexible samples, the sample had to be sandwiched between two half-wavelength (at mid-band) quartz plates to eliminate sagging. Results are reported in the frequency range of 8.6-13.4 GHz for materials such as Teflon, sodium borosilicate glass, and microwave-absorbing materials. >

Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies

Stripline (SL), vector network analyzer (VNA), and pulsed inductive microwave magnetometer (PIMM) techniques were used to measure the ferromagnetic resonance (FMR) linewidth for a series of Permalloy films with thicknesses of 50 and 100nm. The SL-FMR measurements were made for fixed frequencies from 1.5to5.5GHz. The VNA-FMR and PIMM measurements were made for fixed in-plane fields from 1.6to8kA∕m (20–100Oe). The results provide a confirmation, lacking until now, that the linewidths measured by these three methods are consistent and compatible. In the field format, the linewidths are a linear function of frequency, with a slope that corresponds to a nominal Landau-Lifshitz phenomenological damping parameter α value of 0.007 and zero frequency intercepts in the 160–320A∕m (2–4Oe) range. In the frequency format, the corresponding linewidth versus frequency response shows a weak upward curvature at the lowest measurement frequencies and a leveling off at high frequencies.

Ferromagnetic resonance linewidth in metallic thin films: Comparison of measurement methods

Higgs Boson Theory and Phenomenology

A broad-band automated technique for making frequency-swept measurements of complex permittivity and permeability simultaneously is described. Epsilon/sub r/ and µ/sub r/ are computed from S-parameter measurements made on a strip transmission-line device loaded with the material under test. The derivation of epsilon/sub r/ and µ/sub r/ as functions of S/sub 11/ and S/sub 21/ is included, as well as a practical design for a stripline sample holder. Measured epsilon/sub r/ and µ/sub r/ data for several dielectrics and ceramic ferrites is also presented. The technique has been found to have an overall accuracy of better than +-5 percent.

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A Broad-Band, Automated, Stripline Technique for the Simultaneous Measurement of Complex Permittivity and Permeability

Calculations of transverse coupled bunch growth rates in the Advanced Light Source (ALS), a 1.5 GeV electron storage ring for producing synchrotron radiation, indicate the need for damping via a transverse feedback (TFB) system. We present the design of such a system. The maximum bunch frequency is 500 MHz, requiring that the FB system have a broadband response of at least 250 MHz. We describe, in detail, the choice of broadband components such as kickers, pickups, power amplifiers, and electronics. >

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Design of the PEP-II transverse coupled-bunch feedback system

Commissioning results of the ALS transverse coupled-bunch feedback system are discussed. New test results concerning baseband quadrature processing, heterodyne/homodyne detection, and simultaneous operation of the transverse and longitudinal systems are presented.

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Commissioning of the ALS transverse coupled-bunch feedback system

In many particle accelerators, a large number of high frequency beam position monitors (BPMs) are required to track and correct the orbit of the beam. Therefore, simple, sensitive, low cost pickup designs for such BPMs are of widespread interest. In this paper, a general analysis of arbitrarily terminated thin wire stripline or

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A General Analysis of Thin Wire Pickups for High Frequency Beam Position Monitors

In order to effectively control a large number of transverse coupled-bunch models in the LBL Advanced Light source (ALS) storage ring, a broad-band, bunch-by-bunch feedback system has been designed, and is beginning to undergo testing and commissioning. This paper addresses the major electronic components of the feedback system. In particular, the components described include: broad-band microwave position detection receivers, closed orbit offset signal rejection circuitry, and baseband quadrature processing circuitry. Initial commissioning results are also presented.

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W. Barry

Papers

A Broad-Band, Automated, Stripline Technique for the Simultaneous Measurement of Complex Permittivity and Permeability

Design of the PEP-II transverse coupled-bunch feedback system

Commissioning of the ALS transverse coupled-bunch feedback system

A General Analysis of Thin Wire Pickups for High Frequency Beam Position Monitors

Transverse coupled-bunch feedback in the Advanced Light Source (ALS)