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Warren David Grobman

Researcher at IBM

Publications -  14
Citations -  430

Warren David Grobman is an academic researcher from IBM. The author has contributed to research in topics: Angle-resolved photoemission spectroscopy & Photolithography. The author has an hindex of 8, co-authored 14 publications receiving 424 citations.

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Photoemission spectroscopy using synchrotron radiation. I. Overviews of valence-band structure for Ge, GaAs, GaP, InSb, ZnSe, CdTe, and Agl

TL;DR: In this article, the authors used photoemission spectra obtained from synchrotron radiation from an electron storage ring, a double-pass, electrostatic, electron energy analyzer, and samples cleaved and measured in situ in ultrahigh vacuum.
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Electronic structure of Si O 2 , Si x Ge 1 − x O 2 , and Ge O 2 from photoemission spectroscopy

TL;DR: In this paper, the authors investigated the valence-band structure of mixed silicate and found that the width of the nonbonding bands at the top of the Valence band decreases from about 33 eV in Si${\mathrm{O}}_{2}$ to 20 eV by using the oxygen wave-function overlap.
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Angle-resolved photoemission from molecules in the independent-atomic-center approximation

TL;DR: In this article, the authors consider the problem of computing the total amplitude for photoemission from an oriented molecule, which is the sum of the amplitude of coherent emission from spherically symmetric regions at the atomic centers.
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Photoemission spectroscopy using synchrotron radiation. II. The electronic structure of germanium

TL;DR: In this paper, the position of energy bands at symmetry points for both filled and empty bands within 1 Ry of the gap was determined using anisotropic direct transition model of photoemission applicable to cleaved singlecrystal semiconductors.