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William A. Syverson
Researcher at IBM
Publications - 19
Citations - 304
William A. Syverson is an academic researcher from IBM. The author has contributed to research in topics: Wafer & Supercritical carbon dioxide. The author has an hindex of 9, co-authored 19 publications receiving 304 citations.
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Patent
Reduction of foreign particulate matter on semiconductor wafers
TL;DR: In this paper, a solution consisting of sulfuric acid, hydrogen peroxide and a very small amount of hydrofluoric acid was used to reduce foreign particulate matter contamination on semiconductor wafers.
PatentDOI
Apparatus for uniform cleaning of wafers using megasonic energy
TL;DR: In this article, the anti-reflection mechanism is disposed within the tank in close association with the at least one sidewall or bottom structure of the tank to minimize reflection of megasonic energy from the associated surface.
Patent
Sonic cleaning with an interference signal
TL;DR: In this paper, an array of ultrasonic or megasonic transducers is used to clean a substrate by providing a higher intensity beam than is available from uncoupled transducers to facilitate removal of smaller particles.
Patent
Cleaning of semiconductor wafers by contaminate encapsulation
Nicole S. Carpenter,Joseph R. Drennan,Alison K. Easton,Casey J. Grant,Andrew S. Hoadley,Kenneth F. McAvey,Joel M. Sharrow,William A. Syverson,Kenneth H. Yao +8 more
TL;DR: In this paper, an apparatus and method for removing contaminate particulate matter from substrate surfaces such as semiconductor wafers is described. Butts et al. use a material, preferably a liquid curable polymer, which is applied as a sacrificial coating to the surface of a substrate containing contaminates.
Patent
Method for uniform cleaning of wafers using megasonic energy
TL;DR: In this article, the anti-reflection mechanism is disposed within the tank in close association with the at least one sidewall or bottom structure of the tank to minimize reflection of megasonic energy from the associated surface.