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X.W. Cai

Researcher at Xiamen University

Publications -  7
Citations -  102

X.W. Cai is an academic researcher from Xiamen University. The author has contributed to research in topics: Highly oriented pyrolytic graphite & Raman spectroscopy. The author has an hindex of 5, co-authored 7 publications receiving 102 citations.

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Nanomodification of polypyrrole and polyaniline on highly oriented pyrolytic graphite electrodes by atomic force microscopy

TL;DR: In this paper, the first observation of localized electropolymerization of pyrrole and aniline on highly oriented pyrolytic graphite (HOPG) substrates under atomic force microscopy (AFM) tip−...
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Electrochemical oscillatory behavior under a scanning electrochemical microscopic configuration

TL;DR: In this paper, the authors investigated the diffusion coupled oscillatory behavior of the Au|HCI system in the presence of substrate feedback in the scanning electrochemical microscopic (SECM) system and showed that the amplitude of current oscillation can be increased significantly with a slight decrease in the oscillation frequency when the Pt substrate is positioned close to the small Au oscillating electrode.
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STM tip-induced nanoscale etching on the H-terminated n-Si(111) surfaces under the potential control

TL;DR: In this article, the H-terminated n -Si(111) surface was found to be etched locally under the STM tip in the dilute HF solution by applying a given positive potential to the tip while keeping the silicon electrode potential near its flatband potential, at which the oxidative etching of silicon is not expected to occur in the absence of light.
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In-situ characterization of C60 coalescence reaction

TL;DR: In this article, the UV radiation-induced coalescence reaction of C 60 was in situ monitored by Raman spectroscopy for the first time, and the process was also characterized by STM and laser desorption mass spectrometry.
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Experimental strategies for continuous measurements of I-t transients of a silver single nucleus on carbon microelectrodes

TL;DR: In this paper, a method of destroying or avoiding the historic effect of the substrate was developed, which provides a new way of performing a large number of electrochemical measurements without mechanical polishing and manual interference, and therefore facilitates further more detailed studies of a system which requires continuous and automatic I-t transient measurements of statistical meaning.