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X.Z. Xing
Researcher at University of Science and Technology of China
Publications - 1
Citations - 10
X.Z. Xing is an academic researcher from University of Science and Technology of China. The author has contributed to research in topics: Measurement uncertainty & Diffraction. The author has an hindex of 1, co-authored 1 publications receiving 10 citations.
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High accuracy microdimension measurement system by using laser and CCD
TL;DR: In this paper, a microdimension measurement system, using one-dimensional CCD as the sensor, was developed for measuring thin wire or slit, based on Fraunhofer's diffraction.