The main characteristic of Reconfigurable Computing is the presence of hardware that can be reconfigured to implement specific functionality more suitable for specially tailored hardware than on a simple uniprocessor. Reconfigurable computing systems join microprocessors and programmable hardware in order to take advantage of the combined strengths of hardware and software and have been used in applications ranging from embedded systems to high performance computing. Many of the fundamental theories have been identified and used by the Hardware/Software Co-Design research field. Although the same background ideas are shared in both areas, they have different goals and use different approaches.This book is intended as an introduction to the entire range of issues important to reconfigurable computing, using FPGAs as the context, or "computing vehicles" to implement this powerful technology. It will take a reader with a background in the basics of digital design and software programming and provide them with the knowledge needed to be an effective designer or researcher in this rapidly evolving field.

· Treatment of FPGAs as computing vehicles rather than glue-logic or ASIC substitutes
· Views of FPGA programming beyond Verilog/VHDL
· Broad set of case studies demonstrating how to use FPGAs in novel and efficient ways

Reconfigurable Computing: The Theory and Practice of FPGA-Based Computation

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability. 
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Table of Contents

Chapter 1 - Introduction
Chapter 2 - Design for Testability
Chapter 3 - Logic and Fault Simulation 
Chapter 4 - Test Generation 
Chapter 5 - Logic Built-In Self-Test
Chapter 6 - Test Compression
Chapter 7 - Logic Diagnosis
Chapter 8 - Memory Testing and Built-In Self-Test
Chapter 9 - Memory Diagnosis and Built-In Self-Repair
Chapter 10 - Boundary Scan and Core-Based Testing
Chapter 11 - Analog and Mixed-Signal Testing
Chapter 12 - Test Technology Trends in the Nanometer Age

VLSI Test Principles and Architectures: Design for Testability

In this paper we present a novel integrated approach to on-line FPGA testing, diagnosis, and fault-tolerance, to be used in high-reliability and high-availability hardware. The test process takes place in self-testing areas (STARs) of the FPGA, without disturbing the normal system operation. The entire chip is eventually tested by having (STARs) gradually rove across the FPGA. Our approach guarantees complete testing of programmable logic blocks and interconnect, and provides maximum diagnostic resolution. A new fault-tolerant (FT) technique allows using partially defective FPGA resources for normal operation, providing longer mission life-span in the presence of faults. We also introduce the basic concepts of a new dynamic FT method, spare resources needed to bypass a fault are always in the neighborhood of the located fault, thus simplifying fault-bypassing.

Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. 

This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.

KEY FEATURES
* Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples.
* Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book.
* Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits.
* Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing.
* Practical problems at the end of each chapter for students.

System-on-Chip Test Architectures: Nanometer Design for Testability

We present a new technique for testing field programmable gate arrays (FPGA's) based on look-up tables (LUT's). We consider a generalized structure for the basic FPGA logic element (cell); it includes devices such as LUT's, sequential elements (flip-flops), multiplexers and control circuitry. We use a hybrid fault model for these devices. The model is based on a physical as well as a behavioral characterization. This permits detection of all single faults (either stuck-at or functional) and some multiple faults using repeated FPGA reprogramming. We show that different arrangements of disjoint one-dimensional (l-D) cell arrays with cascaded horizontal connections and common vertical input lines provide a good logic testing regimen. The testing time is independent of the number of cells in the array (C-testability), We define new conditions for C-testability of programmable/reconfigurable arrays. These conditions do not suffer from limited I/O pins. Cell configuration affects the controllability/observability of the iterative array. We apply the approach to various Xilinx FPGA families and compare it to prior work.

Testing configurable LUT-based FPGA's

The intrinsic mechanical properties of NbTaTiZr and the influence of alloying elements Mo and W: A first-principles study

Ab initio study of mechanical properties of hexagonal high-entropy ceramic (Mo0.25Nb0.25Ta0.25V0.25)(Al0.5Si0.5)2 with dual mixing of cation and anion sublattice

Xiao-Tao Chen

Papers

Testing configurable LUT-based FPGA's

The intrinsic mechanical properties of NbTaTiZr and the influence of alloying elements Mo and W: A first-principles study

Ab initio study of mechanical properties of hexagonal high-entropy ceramic (Mo0.25Nb0.25Ta0.25V0.25)(Al0.5Si0.5)2 with dual mixing of cation and anion sublattice