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Xiaolei Lu
Researcher at Tongji University
Publications - 1
Citations - 115
Xiaolei Lu is an academic researcher from Tongji University. The author has contributed to research in topics: Nonlinear dimensionality reduction & Pattern recognition (psychology). The author has an hindex of 1, co-authored 1 publications receiving 70 citations.
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Wafer Map Defect Detection and Recognition Using Joint Local and Nonlocal Linear Discriminant Analysis
Jianbo Yu,Xiaolei Lu +1 more
TL;DR: In this article, a manifold learning-based wafer map defect detection and recognition system is proposed to discover intrinsic manifold information that provides the discriminant characteristics of the defect patterns, and an unsupervised version of JLNDA is further developed to provide a monitoring chart for defect detection of wafer maps.