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Xilong Liu
Researcher at Chinese Academy of Sciences
Publications - 55
Citations - 994
Xilong Liu is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Mobile robot & Orientation (computer vision). The author has an hindex of 11, co-authored 47 publications receiving 496 citations.
Papers
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Detection of Power Line Insulator Defects Using Aerial Images Analyzed With Convolutional Neural Networks
TL;DR: A novel deep convolutional neural network (CNN) cascading architecture for performing localization and detecting defects in insulators is proposed, which uses a CNN based on a region proposal network to transform defect inspection into a two-level object detection problem.
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Automatic Metallic Surface Defect Detection and Recognition with Convolutional Neural Networks
TL;DR: This paper discusses the automatic detection of metallic defects with a twofold procedure that accurately localizes and classifies defects appearing in input images captured from real industrial environments using a novel cascaded autoencoder (CASAE) architecture.
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Image Dynamics-Based Visual Servoing for Quadrotors Tracking a Target With a Nonlinear Trajectory Observer
TL;DR: An image dynamics-based visual servoing for quadrotors is proposed to realize stable hovering and tracking and a trajectory observer based on nonlinear tracking-differentiator to estimate trajectory parameters of the target is firstly integrated into the quadrotor with image dynamics, which guarantees a satisfactory performance.
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Vision-Based Target-Following Guider for Mobile Robot
TL;DR: In the authors' experiments, the robot can robustly follow the human target over a long distance, which strongly proved the validity of the target-following guider.
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Weak scratch detection and defect classification methods for a large-aperture optical element
TL;DR: This method can detect multiple types of weak scratches in complex images and that the defects can be correctly distinguished with interference, and satisfies the real-time and accurate detection requirements of surface defects.