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Xiujiang Rong

Researcher at University of Michigan

Publications -  7
Citations -  341

Xiujiang Rong is an academic researcher from University of Michigan. The author has contributed to research in topics: Dot pitch & Noise spectral density. The author has an hindex of 5, co-authored 7 publications receiving 331 citations.

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Journal ArticleDOI

Strategies to improve the signal and noise performance of active matrix, flat‐panel imagers for diagnostic x‐ray applications

TL;DR: Noise reduction and gain enhancement could lead to the development of AMFPIs with high DQE performance which are capable of providing both high resolution radiographic images, at approximately 100 microm pixel resolution, as well as variable resolution fluoroscopic images at 30 fps.
Journal ArticleDOI

Additive noise properties of active matrix flat-panel imagers

TL;DR: A detailed theoretical and empirical investigation of additive noise for indirect detection, active matrix flat-panel imagers (AMFPIs) has been performed, finding reasonable degree of agreement observed between measurements and model predictions provides strong evidence that the role of TFT thermal noise has been properly incorporated into the model.
Proceedings ArticleDOI

A large-area, 97 μm pitch, indirect-detection, active matrix, flat-panel imager (AMFPI)

TL;DR: In this article, the development of the highest resolution, large-area, active-matrix, flat-panel, imager (AMFPI) is described, which is based on a 97 micrometer pixel pitch array with each pixel comprising a single a-Si:H TFT coupled to a discrete aSi n-i-p photodiode.
Journal ArticleDOI

A quantitative investigation of additive noise reduction for active matrix flat-panel imagers using compensation lines

TL;DR: A quantitative investigation of a technique for reducing correlated noise in indirect detection active matrix flat-panel imagers has been reported and it was found that the use of a single compensation line dramatically reduces external noise through removal of the correlated noise component.
Proceedings ArticleDOI

Improved spatial resolution in flat-panel imaging systems

TL;DR: In this article, a flat-panel amorphous silicon (a-Si:H) X-ray imaging system with a Gd2O2S:Tb (GOS) phosphor screen was investigated and the pre- sampled modulation transfer function (psMTF) of the system was measured at diagnostic Xray energies and compared to the value predicted from a knowledge of the spatial resolution of individual system components.