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Xu Zhang
Researcher at Harbin Institute of Technology
Publications - 4
Citations - 40
Xu Zhang is an academic researcher from Harbin Institute of Technology. The author has contributed to research in topics: Tin & Thermoelectric effect. The author has an hindex of 2, co-authored 4 publications receiving 10 citations.
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Journal ArticleDOI
Unambiguous determination of crystal orientation in black phosphorus by angle-resolved polarized Raman spectroscopy.
Bo Zou,Yadong Wei,Yan Zhou,Dingning Ke,Xu Zhang,Meng Zhang,Cho-Tung Yip,Xiaobin Chen,Weiqi Li,Huarui Sun +9 more
TL;DR: In this article, the authors clarified two key controversies about the physical origin of the intricate ARPRS response and the determination of crystal orientations in black phosphorous (BP) and showed that the degree of anisotropy of the response evolves gradually and periodically with BP thickness, eventually leading to the intricate response.
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Thickness-Dependent Ultralow In-Plane Thermal Conductivity of Chemical Vapor-Deposited SnSe2 Nanofilms: Implications for Thermoelectrics
TL;DR: Tin diselenide (SnSe2) as a two-dimensional semiconductor material shows great potential in nanoscale electronics, optoelectronics, and thermoelectric applications; however, much is unclear about i...
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Surface modification on copper particles toward graphene reinforced copper matrix composites for electrical engineering application
Devadatta Das,Shengcheng Shu,Shengcheng Shu,Zhang Qiang,Joerg Ihde,Qilong Yuan,Wen Dai,Mingliang Wu,Dan Dai,Ke Yang,Bo Wang,Chen Xue,Ma Hongbing,Xu Zhang,Jiemin Han,Xuyuan Chen,Cheng-Te Lin,Wanbin Ren,Yifei Ma,Nan Jiang +19 more
TL;DR: In this article, a gel-assisted route was designed to synthesize high-quality graphene nanoplatelets modified monodispersed copper particles, followed by hot pressing to fabricate graphene reinforced copper matrix composites bulk.
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Thermal conductivity of exfoliated and chemical vapor deposition-grown tin disulfide nanofilms: role of grain boundary conductance
TL;DR: In this article, the in-plane thermal conductivities of mechanically exfoliated single-crystalline and chemical vapor deposition (CVD)-grown polycrystallized SnS2 nanofilms measured using the Raman optothermal technique were compared.