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Y. K. Han
Researcher at Samsung
Publications - 1
Citations - 79
Y. K. Han is an academic researcher from Samsung. The author has contributed to research in topics: Ultrasonic testing & Scattering. The author has an hindex of 1, co-authored 1 publications receiving 73 citations.
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Ultrasonic backscattering in duplex microstructures: Theory and application to titanium alloys
Y. K. Han,R. B. Thompson +1 more
TL;DR: In this article, a theory for the ultrasonic backscattering in duplex microstructures is presented, where the macrograins are assumed to be prior beta grains and the colonies are alpha phase produced by a martensitic transformation.