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Y. Nozuyama
Researcher at Toshiba
Publications - 3
Citations - 33
Y. Nozuyama is an academic researcher from Toshiba. The author has contributed to research in topics: Macroblock & Fault coverage. The author has an hindex of 3, co-authored 3 publications receiving 33 citations.
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Proceedings ArticleDOI
Design for testability of a 32-bit microprocessor-the TX1
TL;DR: Testable designs of the TX1, a 32-bit microprocessor based on the TRON architecture, are described, resulting in three testable design approaches implemented in an optimized form.
Proceedings ArticleDOI
Implementation and evaluation of microinstruction controlled self test using a masked microinstruction scheme
TL;DR: A maskedmicroinstruction scheme which reduces the size of the test microprogram used for a microinstruction-controlled self-test, a type of built-in self- test, is described and its efficiency is discussed.
Proceedings ArticleDOI
Realization of an efficient design verification test used on a microinstruction controlled self test
TL;DR: A unified test (UT), which realizes an efficient design verification test (EDVT) based on a microinstruction-controlled self-test (MST), is described, which features large flexibility of test data supply and high observability of response data from the macroblock, including exact AC performance information.