scispace - formally typeset
Y

Ye Wei

Researcher at University of Science and Technology of China

Publications -  6
Citations -  198

Ye Wei is an academic researcher from University of Science and Technology of China. The author has contributed to research in topics: Feature (computer vision) & Convolutional neural network. The author has an hindex of 3, co-authored 6 publications receiving 116 citations.

Papers
More filters
Journal ArticleDOI

Automatic Detection of Welding Defects using Deep Neural Network

TL;DR: An automatic detection schema including three stages for weld defects in x-ray images including three steps based on deep neural network is proposed to detect welded joints quality.
Journal ArticleDOI

Deep features based on a DCNN model for classifying imbalanced weld flaw types

TL;DR: This paper developed a model based on a deep convolutional neural network (DCNN) to extract the deep features directly from X-ray images, achieving an accuracy of 97.2%, which is considerably higher than that obtained using the traditional feature extraction methods.
Patent

Forging press machine operation condition information acquisition and analysis system based on the internet of things technology

TL;DR: In this article, a forging press machine operation condition information acquisition and analysis system based on the internet of things technology is presented, in which the operation condition analog quantity is obtained through a sensor; the forging press operation condition switching values are obtained through acquiring the PLC signal points; the information contents are processed by a data acquisition terminal interface circuit and then transmitted to processor chips of the data acquisition terminals, then the contents are transmitted to a cloud server through a GPRS communication module for the convenience of data sharing.
Journal ArticleDOI

Technique for two-dimensional displacement field determination using a reliability-guided spatial-gradient-based digital image correlation algorithm.

TL;DR: A linear illumination model between images before and after deformation to guarantee intensity invariability and a reliability-guided strategy to find the matching points accurate to 0.5 pixels in the reference and deformed images.