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Yifeng Tan

Researcher at Beijing Institute of Technology

Publications -  5
Citations -  35

Yifeng Tan is an academic researcher from Beijing Institute of Technology. The author has contributed to research in topics: Moiré pattern & Interferometry. The author has an hindex of 4, co-authored 5 publications receiving 27 citations.

Papers
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Journal ArticleDOI

Vertex radius of curvature error measurement of aspheric surface based on slope asphericity in partial compensation interferometry.

TL;DR: This paper introduces VROC error measurement of aspheric surface by using slope asphericity with partial compensation interferometry and indicates that the method exhibits relative measurement accuracy of 0.01% when the nominal VROC is 889 mm, and the decoupled SFE error is λ/10 of the peak-to-valley value.
Journal ArticleDOI

Two-step carrier-wave stitching method for aspheric and freeform surface measurement with a standard spherical interferometer.

TL;DR: A two-step carrier-wave stitching method to enlarge the measurement bandwidth of a digital Moiré interferometry is proposed and has potential for flexible measurement of aspheric and freeform surfaces.
Patent

Digital moire fringe phase extraction method combining wavelet analysis and low pass filtering

TL;DR: In this article, a digital moire fringe phase extraction method combining wavelet analysis and low-pass filtering is described, which belongs to the optical measurement and image processing technology field.
Patent

Digital Moire fringe phase extraction method based on nonlinear optimization

TL;DR: In this article, a digital Moire fringe phase extraction method based on nonlinear optimization is proposed, in which a Moire synthesis light intensity distribution graph mathematical model is established, a fringe phase is used as an optimization variable, with actual Moire synthesized graph light intensity distributions as optimization target, phase continuity is taken as a boundary condition, and the fringe phase at that time is the Moire residue phase of the actual synthesis graph.
Proceedings ArticleDOI

Digital Moiré based transient interferometry and its application in optical surface measurement

TL;DR: In this paper, a wavelet transform is proposed to extract phase from the fringe pattern with spectrum aliasing, which makes DMTI prospective in surface figure error measurement for intelligent fabrication of aspheric surfaces.