Y
Yihai Zhu
Researcher at University of Rhode Island
Publications - 31
Citations - 1098
Yihai Zhu is an academic researcher from University of Rhode Island. The author has contributed to research in topics: Cascading failure & Smart grid. The author has an hindex of 14, co-authored 30 publications receiving 899 citations. Previous affiliations of Yihai Zhu include University of Science and Technology of China & Salesforce.com.
Papers
More filters
Journal ArticleDOI
Local line directional pattern for palmprint recognition
TL;DR: A new feature input space is proposed and an LBP-like descriptor that operates in the local line-geometry space is defined, thus proposing a new image descriptor, local line directional patterns (LLDP).
Journal ArticleDOI
Revealing cascading failure vulnerability in power grids using risk-graph
TL;DR: It is discovered that attack strategies that select target nodes (TNs) based on load and degree do not yield the strongest attacks, so a novel metric is proposed, called the risk graph, and novel attack strategies are developed that are much stronger than the load-based and degree-based attack strategies.
Journal ArticleDOI
Palmprint Recognition Based on Complete Direction Representation
TL;DR: This paper proposes a general framework for DR-based method named complete DR (CDR), which reveals DR by a comprehensive and complete way and has fast matching speed, making it quite suitable for the large-scale identification applications.
Book ChapterDOI
Survey of gait recognition
Ling-Feng Liu,Wei Jia,Yihai Zhu +2 more
TL;DR: In this paper, a comprehensive survey of video based gait recognition approaches is presented and the research challenges and future directions of the gaitrecognition are discussed.
Journal ArticleDOI
Resilience Analysis of Power Grids Under the Sequential Attack
TL;DR: A new attack scenario is discovered, called the sequential attack, which assumes that substations/transmission lines can be removed sequentially, not synchronously, and can discover many combinations of substation whose failures can cause large blackout size.