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Yihua Lu

Researcher at South China University of Technology

Publications -  8
Citations -  36

Yihua Lu is an academic researcher from South China University of Technology. The author has contributed to research in topics: Template matching & Computer science. The author has an hindex of 3, co-authored 8 publications receiving 25 citations.

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Micro-motion detection of the 3-DOF precision positioning stage based on iterative optimized template matching.

TL;DR: In this method, a micro-vision system is constructed and employed to capture magnified images of the measured PPS's surface with high quality and an efficient and accurate IOTM algorithm is proposed to detect the micro-motion of the 3-DOF PPS.
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A magnification-continuous calibration method for SEM-based nanorobotic manipulation systems

TL;DR: The results demonstrate that the proposed method is effective and practical for calibrating SEM-based nanorobotic manipulation systems under a wide range of continuous magnifications and the relative error is within 1%.
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A simplified focusing and astigmatism correction method for a scanning electron microscope

TL;DR: In this article, a simplified method for focusing and astigmatism correction of a scanning electron microscope (SEM) is presented, which consists of two steps, in the first step, the fast Fourier transform (FFT) of the SEM image is performed and the FFT is subsequently processed with a threshold to achieve a suitable result.
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Edge determination improvement of scanning electron microscope images by inpainting and anisotropic diffusion for measurement and analysis of microstructures

TL;DR: A method for improving the edge determination of actual scanning electron microscope (SEM) images for analyzing and measuring microstructures is proposed in this paper, where inpainting and adaptive anisotropic diffusion strategies are developed.
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A robust edge-based template matching algorithm for displacement measurement of compliant mechanisms under scanning electron microscope

TL;DR: In this article, a robust edge-based template matching algorithm for displacement measurement of compliant mechanisms under a scanning electron microscope (SEM) was developed, which consists of three steps: first, the Sobel gradient operator and a self-adaptive segment strategy are used to establish the shape model in which the gradient directions of the object's edge points are calculated.