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Yinglei Ren

Researcher at Intel

Publications -  18
Citations -  52

Yinglei Ren is an academic researcher from Intel. The author has contributed to research in topics: Fext & Signal integrity. The author has an hindex of 4, co-authored 17 publications receiving 36 citations.

Papers
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Proceedings ArticleDOI

Inter-layer crosstalk management in differential dual-striplines

TL;DR: In this paper, differential dual-stripline crosstalk is investigated, and a complete design strategy is provided to mitigate the impact of inter-layer ILC, and as a result, enable high-density PCB layout, achieve compact form factor, and save the bill of material (BOM) cost.
Proceedings ArticleDOI

Switching voltage regulator noise coupling to connector signal pins through near field radiation

TL;DR: In this article, a simulation flow was developed to reproduce the EMI phenomenon in a server system, where switching voltage regulator (VR) noise coupled to the IO pins of the adjacent memory riser connector through the open air above the base board, and the link performance was impacted by the coupling.
Proceedings ArticleDOI

VR noise analysis and reduction in printed circuit board designs

TL;DR: In this paper, the authors introduce systematic ways of reducing VR noise as well as VR noise analysis methods, and a real design case with VR noise issue is shared with simulation and measurement results.
Proceedings ArticleDOI

A new design flow to evaluate high-speed SerDes link performance with re-driver

TL;DR: In this article, a measurement based methodology is proposed and introduced to provide a flow and methodology to evaluate re-driver link performance, which is based on re-drivers assessment board to obtain reference channel through measurement by meeting industry IO specifications.
Proceedings ArticleDOI

Crosstalk analysis for dual stripline with parallel and angled routing

TL;DR: Analytical and empirical algorithms are proposed to estimate the crosstalk waveforms from multiple aggressors, which provide quick design risk assessment, and the waveform is well correlated to the 3D full wave EM simulation results.