Showing papers by "Yuhong Wang published in 2001"

PZT thin films with preferred-orientation induced by external stress

Abstract: The microstnicture of oriented Pb(Zr0.7Ti0.3)O3 thin films prepared via sol-gel method has been carefully investigated. After the precursor was heated, the resultant thin film displayed (100)-preferred orientation because of accumulation of the colloidal particles. X-ray diffraction (XRD) result indicated that the strong ⟨100⟩- or ⟨111⟩-prefered orientation of the PZT thin films could be observed when the substrates were slightly bent under appropriate external stresses during annealing procedure. Atomic force microscope (AFM) image revealed that (100)-oriented grains aggregated in some separate zones. The above results can be well explained in view of internal stress during crystallization.