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Yvon Lacroute

Researcher at University of Burgundy

Publications -  44
Citations -  1982

Yvon Lacroute is an academic researcher from University of Burgundy. The author has contributed to research in topics: Plasmon & Surface plasmon. The author has an hindex of 15, co-authored 44 publications receiving 1898 citations. Previous affiliations of Yvon Lacroute include Centre national de la recherche scientifique & Institute of Certified Bookkeepers.

Papers
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Squeezing the Optical Near-Field Zone by Plasmon Coupling of Metallic Nanoparticles

TL;DR: In this article, the experimental observation of near-field optical effects close to Au nanoparticles using a photon scanning tunneling microscope (PSTM) allowed an unprecedented direct comparison with theoretical computations of the optical near field intensity.
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Near-field observation of surface plasmon polariton propagation on thin metal stripes

TL;DR: In this paper, a photon scanning tunneling microscope was used to probe the field of surface plasmon polariton modes excited on finite-width thin metal films (metal stripes).
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Optical near-field distributions of surface plasmon waveguide modes

TL;DR: In this paper, the optical near-field distributions of the surfaceplasmon (sp) modes sustained by the stripes were recorded using a photon scanning tunneling microscope (PSTM) for a fixed frequency of the incident light, these field distributions were found to depend on the width of the stripes.
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Imaging the local density of states of optical corrals.

TL;DR: The images obtained by a scanning near-field optical microscope under specific operational conditions are found in agreement with the theoretical maps of the optical local density of states.
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Near-field characterization of Bragg mirrors engraved in surface plasmon waveguides

TL;DR: In this article, a finite length periodic arrangement of narrow slits can reflect a surface plasmon mode propagating along a surface waveguides (SPW) and the reflection efficiency of the micrograting is found to depend upon the number of slits, the period of the grating, and the incident wavelength.