E
Eric Bourillot
Researcher at Centre national de la recherche scientifique
Publications - 72
Citations - 1925
Eric Bourillot is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: Scanning tunneling microscope & Total internal reflection. The author has an hindex of 18, co-authored 69 publications receiving 1762 citations. Previous affiliations of Eric Bourillot include University of Burgundy.
Papers
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Journal ArticleDOI
Squeezing the Optical Near-Field Zone by Plasmon Coupling of Metallic Nanoparticles
Joachim R. Krenn,Alain Dereux,Jean-Claude Weeber,Eric Bourillot,Yvon Lacroute,J. P. Goudonnet,Gerburg Schider,W. Gotschy,Alfred Leitner,Franz R. Aussenegg,Christian Girard +10 more
TL;DR: In this article, the experimental observation of near-field optical effects close to Au nanoparticles using a photon scanning tunneling microscope (PSTM) allowed an unprecedented direct comparison with theoretical computations of the optical near field intensity.
Journal ArticleDOI
Imaging the local density of states of optical corrals.
C. Chicanne,T. David,Romain Quidant,Jean-Claude Weeber,Yvon Lacroute,Eric Bourillot,Alain Dereux,G. Colas des Francs,Christian Girard +8 more
TL;DR: The images obtained by a scanning near-field optical microscope under specific operational conditions are found in agreement with the theoretical maps of the optical local density of states.
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Direct observation of localized surface plasmon coupling
Joachim R. Krenn,Jean-Claude Weeber,Alain Dereux,Eric Bourillot,J. P. Goudonnet,B. Schider,Alfred Leitner,Franz R. Aussenegg,C. Girard +8 more
TL;DR: In this paper, the surface plasmons are excited in gold nanostructures tailored by electron beam lithography, and the energy transfer from a resonantly excited nanoparticle to a nanowire, which is not directly excited by the incident light is observed.
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Effects of temperature and pressure on microcantilever resonance response
Johann Mertens,Eric Finot,Thomas Thundat,Arnaud Fabre,Arnaud Fabre,Marie-Hélène Nadal,Vincent Eyraud,Eric Bourillot +7 more
TL;DR: The results for a silicon cantilever under vacuum show that the frequency varies in direct proportion to the temperature, and the linear response is explained by the decrease in Young's modulus with increasing the temperature but when the cantilevers is bimaterial, the response is nonlinear due to differential thermal expansion.
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Detection of defects buried in metallic samples by scanning microwave microscopy
Cédric Plassard,Eric Bourillot,Jérôme Rossignol,Yvon Lacroute,E. Lepleux,L. Pacheco,Eric Lesniewska +6 more
TL;DR: In this paper, the authors reported the local detection of buried calibrated metal defects in metal samples by a new experimental technique, scanning microwave microscopy, which combines the electromagnetic measurement capabilities of a microwave vector network analyzer with the sub-nanometer-resolution capabilities of an atomic force microscope.