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Yvon Tharrault

Researcher at Nancy-Université

Publications -  14
Citations -  147

Yvon Tharrault is an academic researcher from Nancy-Université. The author has contributed to research in topics: Fault detection and isolation & Principal component analysis. The author has an hindex of 4, co-authored 14 publications receiving 140 citations.

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Journal ArticleDOI

Fault Detection and Isolation with Robust Principal Component Analysis

TL;DR: In this paper, a fast two-step algorithm is proposed for fault detection and isolation based on robust principal component analysis (PCA) which is applied to remove the effect of outliers on the PCA model.
Journal ArticleDOI

WWTP diagnosis based on robust principal component analysis

TL;DR: In this paper, a robust principal component analysis (PCA) was applied to remove the effect of outliers on the PCA model, which is a powerful fault detection and isolation method.
Book ChapterDOI

Sensor Fault Detection and Isolation by Robust Principal Component Analysis

TL;DR: Principal component Analysis is a data-driven method which is particularly well adapted to reveal linear relationships among the plant variables without formulating them explicitly and has also been employed for system identification and has been applied successfully in the monitoring of complex systems.
Journal ArticleDOI

Multiple sensor fault detection and isolation of an air quality monitoring network using RBF-NLPCA model

TL;DR: The reconstruction approach for multiple sensors is proposed in the non-linear case and successfully applied for multiple sensor fault detection and isolation of an air quality monitoring network.

Détection et isolation de défauts par analyse en composantes principales robuste

TL;DR: The modele ACP obtenu etant robuste, c'est-a-dire non contamine par les valeurs aberrantes, son utilisation for le diagnostic est alors efficace, cependant, l'un des inconvenients majeurs of l'ACP resulte de l'utilisation de techniques d'estimation par moindres carres, techniques which echouent souvent a saffranchir des biais de mesure accidentels.