Z
Zhi-Xin Chen
Researcher at Xi'an Jiaotong University
Publications - 6
Citations - 54
Zhi-Xin Chen is an academic researcher from Xi'an Jiaotong University. The author has contributed to research in topics: Speckle pattern & Photogrammetry. The author has an hindex of 3, co-authored 6 publications receiving 45 citations.
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Journal ArticleDOI
Exploitation of photogrammetry measurement system
TL;DR: The measurement results of a large-scale waterwheel blade by XJTUDP show that this photogrammetry system can be applied to industrial measurements.
Journal ArticleDOI
Application of the speckle technique for three-dimensional deformation measurement
TL;DR: This work established the relevant mathematical models and developed a corresponding measurement and analysis software, XJTUDIC, which recorded and analyzed the whole process of tensile deformation and achieved relative error within ±0.75%, demonstrating the reliability, feasibility, and advantage of this method and its corresponding applied software and hardware.
Proceedings ArticleDOI
Application of photogrammetry technology to industrial inspection
TL;DR: XJTUDP software has been successfully developed by oneself based on photogrammetry theory as mentioned in this paper, and the contents of composing and explored of this¯¯¯¯¯¯¯¯¯¯¯¯¯¯¯¯¯¯¯¯system are introduced in this paper.
Proceedings ArticleDOI
Speckle technique applied to precise measurement of strain
TL;DR: In this article, the speckle method was used for accurate measurement of strain, and compared with traditional methods, and carried out specific tensile experiment, showing the method have the advantages of non-contact, high precision, simple and flexible operation, overall measuring and so on.
Journal ArticleDOI
The Research of Speckle Technique in Deformation Measurement Fields
Zhi-Xin Chen,Jin Liang,Cheng Guo +2 more
TL;DR: In this paper, the authors used speckle methods to carry on deformation accurate and comprehensive measuring, and compared the results with using traditional extensometer measurement methods, through calculation got the error is within ± 0.2%.